Virtual CMG'90 Trip Report about Control Chart Usage" I have detailed and very interesting response from my 3rd LinkedIn connection Mike Clayton from Engineering field (not IT at all!). That has a special interest for me as I came from that field originally (my 1st degree is in Engineering) and the SPC concept was originally designed for Engineering application and then adopted for IT via MASF in 1995.
MIKE: Using normally correlated parameters to detect "loss of correlation" as a fault, for example, is common now in monitoring process tools that have many sensors. Loss of expected correlation ties to actual physical faults, right? Is that one of the things you are finding in your history search? FDC as part of APC which has augmented SPC once we have found adjustment algorithms that can be automated based on output parameters IF the toolset or system passes the FDC check....otherwise, call for help?
http://www-mtl.mit.edu/researchgroups/Metrology/PAPERS/goodlin-fault-detect-jecs2003.pdf http://www.umetrics.com/fabstat http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5398983&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5398983
I have got the comment on my previous post “ BIRT based Control Chart “ with questions about how actually in BIRT the data are prepared for ...
Final update: The COMPUTER MEASUREMENT GROUP (www.CMG.org) membership has elected me to serve as Director for the 2016 - 2017 term 2015 ...